National Workshop on X-ray technique started today at the Panjab University (PU), Chandigarh.

The three days workshop is being organized by Sophisticated Analytical Instrumentation Facility (SAIF)/ Central Instrumentation Lab (CIL).  The Workshop started with lightening  of lamp by Prof Peddiredi from IIT Bhubaneswar, Prof Indupal Kaur, Director SAIF/CIL, Er HPS Kang and Ramesh Sharma, convener of workshop.

As many as 30 participants from all over the country are participating in the workshop. The participants were excited as they had a chance to have hands on training on XRD and XRF instruments for characterization of material.

In his key note address Professor Pedireddi informed the audience about how the characterization techniques are developed and their importance in modern science. He threw an idea to participants to develop x-ray lens and if this type of lens is invented the total scenario of characterization will change, as we will be able to develop x-ray microscope. He further asked them to find out y-rays which may open further doors to characterization of materials.

Other speakers Dr. P. Natrajan from PU Chemistry Department, and Mr Mainak told about the basic instrument to recent advances in this field.

The vote of thanks was proposed by Er. Ramesh Sharma, Convener of workshop.